A review of measurement of electromagnetic emission in electronic product: Techniques and challenges

Nowadays, electronic products are being used extensively in many fields and applications. The dense population of devices human life has become a challenge for microwave engineers to ensure that their can meet the Electromagnetic Compatibility (EMC) standards. Complex with smaller sizes denser components will be compliance EMC In addition, occurrence non-stationary emission at certain operating modes becomes analysis. Error analyzing EM emissions make unable requirements standards; hence, they prohibited marketed. Currently, there two methods analysis, i.e. by measurement modeling or computation. There some problems, however, analysis regarding area test, complexity, DUT positioning error, installation cost, time consumption. this paper, techniques including Open Area Test Site (OATS), Anechoic chamber, Transverse Electromagnetics TEM Cell, Compact Antenna Range (CATR) near field scanning reviewed comprehensively. This survey covered standards, principles techniques, advantages disadvantages studies applications each technique, recommendations which technique used, challenges future research measurement. final section paper discusses near-field measurements related phenomenon. papers also presents how detect characterize them.